Viewing file:  vcond_6.c (2.22 KB) -rw-r--r--
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/* { dg-do compile } */
/* { dg-options "-O2 -ftree-vectorize" } */
#include <stdint.h>
#define b_and(A, B) ((A) & (B))
#define b_orr(A, B) ((A) | (B))
#define b_eor(A, B) ((A) ^ (B))
#define b_nand(A, B) (!((A) & (B)))
#define b_nor(A, B) (!((A) | (B)))
#define b_bic(A, B) ((A) & !(B))
#define b_orn(A, B) ((A) | !(B))
#define LOOP(TYPE, BINOP) \
void __attribute__ ((noinline, noclone)) \
test_##TYPE##_##BINOP (TYPE *restrict dest, TYPE *restrict src, \
TYPE *restrict a, TYPE *restrict b, \
TYPE *restrict c, TYPE *restrict d, \
TYPE fallback, int count) \
{ \
for (int i = 0; i < count; ++i) \
{ \
TYPE srcv = src[i]; \
dest[i] = (BINOP (__builtin_isunordered (a[i], b[i]), \
__builtin_isunordered (c[i], d[i])) \
? srcv : fallback); \
} \
}
#define TEST_BINOP(T, BINOP) \
T (_Float16, BINOP) \
T (float, BINOP) \
T (double, BINOP)
#define TEST_ALL(T) \
TEST_BINOP (T, b_and) \
TEST_BINOP (T, b_orr) \
TEST_BINOP (T, b_eor) \
TEST_BINOP (T, b_nand) \
TEST_BINOP (T, b_nor) \
TEST_BINOP (T, b_bic) \
TEST_BINOP (T, b_orn)
TEST_ALL (LOOP)
/* ??? We predicate one of the comparisons on the result of the other,
but whether that's a win or a loss will depend on the schedule. */
/* { dg-final { scan-assembler-not {\tand\t} } } */
/* { dg-final { scan-assembler-times {\torr\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 } } */
/* { dg-final { scan-assembler-times {\teor\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 } } */
/* { dg-final { scan-assembler-times {\tnand\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 } } */
/* { dg-final { scan-assembler-times {\tnor\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 } } */
/* Currently we predicate one of the comparisons on the result of the other
and then use NOT, but the original BIC sequence is better. It's a fairly
niche failure though. We'd handle most other types of comparison by
using the inverse operation instead of a separate NOT. */
/* { dg-final { scan-assembler-times {\tbic\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 { xfail *-*-* } } } */
/* { dg-final { scan-assembler-times {\torn\tp[0-9]+\.b, p[0-9]+/z, p[0-9]+\.b, p[0-9]+\.b} 3 } } */
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