Viewing file:  ctf-bitfields-2.c (1.42 KB) -rw-r--r--
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/* The bitfield type (int) may be shared, but slices are not de-duplicated.
In this testcase, it is expected to see a total of 6 CTF slices and 2 CTF
integer types for the bitfields - unsigned long long and signed long long.
cts_offset is the offset of the bitfield into a machine word.
TBD - hardcoding cts_offset checks into the testcase will cause it to break
across targets with different BIT_PER_WORD. Is there a way to add
cts_offset related checks in the testcase? */
/* { dg-do compile ) */
/* { dg-options "-O0 -gctf -dA" } */
/* { dg-final { scan-assembler-times "\[\t \]0x6\[\t \]+\[^\n\]*cts_type" 3 } } */
/* { dg-final { scan-assembler-times "\[\t \]0x2\[\t \]+\[^\n\]*cts_type" 3 } } */
/* { dg-final { scan-assembler-times "\[\t \]0xf\[\t \]+\[^\n\]*cts_bits" 2 } } */
/* { dg-final { scan-assembler-times "\[\t \]0x21\[\t \]+\[^\n\]*cts_bits" 2 } } */
/* { dg-final { scan-assembler-times "\[\t \]0x10\[\t \]+\[^\n\]*cts_bits" 2 } } */
/* { dg-final { scan-assembler-times "ascii \"long long unsigned int.0\"\[\t \]+\[^\n\]*ctf_string" 1 } } */
/* { dg-final { scan-assembler-times "ascii \"long long int.0\"\[\t \]+\[^\n\]*ctf_string" 1 } } */
struct fields
{
unsigned long long u1 : 15;
unsigned long long u2 : 33;
unsigned long long u3 : 16;
signed long long s1 : 15;
signed long long s2 : 33;
signed long long s3 : 16;
} flags;
int i = 33;
int main ()
{
return flags.u1 + i;
}
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